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Temperature dependence of the Urbach edge in GaAs
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- S. R. Johnson
- Department of Physics, University of British Columbia, Vancouver V6T 1Z1, British Columbia, Canada
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- T. Tiedje
- Department of Physics, University of British Columbia, Vancouver V6T 1Z1, British Columbia, Canada
Bibliographic Information
- Published
- 1995-11-01
- DOI
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- 10.1063/1.359683
- Publisher
- AIP Publishing
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Description
<jats:p>The temperature dependence of the optical-absorption edge (Urbach edge) of GaAs is measured in semi-insulating and n-type GaAs (n=2×1018 cm−3) over the temperature range from room temperature to 700 °C. Both the optical absorption and the temperature are measured using a diffuse reflectance technique. The characteristic energy of the exponential absorption edge is found to increase linearly with temperature, from 7.5 meV at room temperature to 12.4 meV at 700 °C, for semi-insulating GaAs. The temperature dependent part of the width of the Urbach edge for semi-insulating GaAs is six times smaller than predicted by the standard theory where the edge width is proportional to the phonon population.</jats:p>
Journal
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- Journal of Applied Physics
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Journal of Applied Physics 78 (9), 5609-5613, 1995-11-01
AIP Publishing
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Details 詳細情報について
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- CRID
- 1363107371004852480
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- DOI
- 10.1063/1.359683
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- ISSN
- 10897550
- 00218979
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- Data Source
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- Crossref

