{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363386073367368192.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1002/ecjb.10107"}},{"identifier":{"@type":"URI","@value":"https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1002%2Fecjb.10107"}},{"identifier":{"@type":"URI","@value":"https://onlinelibrary.wiley.com/doi/pdf/10.1002/ecjb.10107"}},{"identifier":{"@type":"NAID","@value":"210000172120"}}],"dc:title":[{"@value":"Analysis of free‐electron lasers via FDTD method"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:title>Abstract</jats:title><jats:p>The free‐electron laser is a device that generates intense electromagnetic waves in the microwave to optical wave regions by converting the kinetic energy of a relativistic electron beam to that of an electromagnetic wave. In this paper, a method is reviewed for tracing in time the interaction of the electromagnetic wave and the relativistic electron beam in the free‐electron laser by means of the FDTD method. As a specific example, the oscillation and amplification characteristics of a Cherenkov laser are analyzed and the effectiveness of the technique is demonstrated. © 2003 Wiley Periodicals, Inc. Electron Comm Jpn Pt 2, 86(5): 26–36, 2003; Published online in Wiley InterScience (<jats:ext-link xmlns:xlink=\"http://www.w3.org/1999/xlink\" xlink:href=\"http://www.interscience.wiley.com\">www.interscience.wiley.com</jats:ext-link>). DOI 10.1002/ecjb.10107</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1582261707905219072","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000415178804"}],"foaf:name":[{"@value":"Toshiyuki Shiozawa"}]},{"@id":"https://cir.nii.ac.jp/crid/1420564276158359936","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"00335374"},{"@type":"NRID","@value":"1000000335374"},{"@type":"NRID","@value":"9000415160853"},{"@type":"NRID","@value":"9000415178805"},{"@type":"NRID","@value":"9000006798210"},{"@type":"NRID","@value":"9000363402307"},{"@type":"NRID","@value":"9000363144311"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/read0191212"}],"foaf:name":[{"@value":"Akimasa Hirata"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"8756663X"},{"@type":"EISSN","@value":"15206432"}],"prism:publicationName":[{"@value":"Electronics and Communications in Japan (Part II: 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