{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363388843814879232.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1016/j.apsusc.2009.10.075"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0169433209015207?httpAccept=text/xml"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0169433209015207?httpAccept=text/plain"}}],"dc:title":[{"@value":"Structural and optical characteristics of spin-coated ZnO thin films"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1383388843814879232","@type":"Researcher","foaf:name":[{"@value":"M. Smirnov"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388843814879234","@type":"Researcher","foaf:name":[{"@value":"C. Baban"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388843814879233","@type":"Researcher","foaf:name":[{"@value":"G.I. Rusu"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"01694332"}],"prism:publicationName":[{"@value":"Applied Surface Science"}],"dc:publisher":[{"@value":"Elsevier BV"}],"prism:publicationDate":"2010-02","prism:volume":"256","prism:number":"8","prism:startingPage":"2405","prism:endingPage":"2408"},"reviewed":"false","dc:rights":["https://www.elsevier.com/tdm/userlicense/1.0/"],"url":[{"@id":"https://api.elsevier.com/content/article/PII:S0169433209015207?httpAccept=text/xml"},{"@id":"https://api.elsevier.com/content/article/PII:S0169433209015207?httpAccept=text/plain"}],"createdAt":"2009-10-30","modifiedAt":"2018-12-15","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1050010457713759744","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Solution‐Processed‐ZnO‐Mediated Semiconductor Bonding with High Mechanical Stability, Electrical Conductivity, Optical Transparency, and Roughness Tolerance"},{"@value":"Solution-processed-ZnO-mediated semiconductor bonding with high mechanical stability, electrical conductivity, optical transparency, and roughness tolerance"}]},{"@id":"https://cir.nii.ac.jp/crid/1360003449891722240","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"UV-laser-induced orientation of ZnO seed layer crystals for the growth of ZnO nanorods"}]},{"@id":"https://cir.nii.ac.jp/crid/1360285704923267072","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Influence of Surface Morphology and Conductivity on Photocatalytic Performance of Solution‐Processed Zinc Oxide Film"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001288096252672","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Seed layer morphology influencing on ZnO nanorod growth by hydrothermal synthesis"}]},{"@id":"https://cir.nii.ac.jp/crid/1390282763122050944","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"One Step Fabrication of ZnO Films Using a Modified Gas-assisted Liquid Phase Deposition Process"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1016/j.apsusc.2009.10.075"},{"@type":"CROSSREF","@value":"10.7567/jjap.57.070306_references_DOI_93abvHUg5OxBsFlIu2NrMbDPxeY"},{"@type":"CROSSREF","@value":"10.14723/tmrsj.43.349_references_DOI_93abvHUg5OxBsFlIu2NrMbDPxeY"},{"@type":"CROSSREF","@value":"10.1246/cl.180975_references_DOI_93abvHUg5OxBsFlIu2NrMbDPxeY"},{"@type":"CROSSREF","@value":"10.1002/asia.201700807_references_DOI_93abvHUg5OxBsFlIu2NrMbDPxeY"},{"@type":"CROSSREF","@value":"10.1002/admi.201900921_references_DOI_93abvHUg5OxBsFlIu2NrMbDPxeY"}]}