著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Chi-Jie Lu and Du-Ming Tsai,Automatic defect inspection for LCDs using singular value decomposition,The International Journal of Advanced Manufacturing Technology,0268-3768,Springer Science and Business Media LLC,2004-06-02,25,1-2,53-61,https://cir.nii.ac.jp/crid/1363388845436193024,https://doi.org/10.1007/s00170-003-1832-6