{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363388845458869760.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1063/1.1139078"}},{"identifier":{"@type":"URI","@value":"https://pubs.aip.org/aip/rsi/article-pdf/57/11/2680/19251029/2680_1_online.pdf"}},{"identifier":{"@type":"NAID","@value":"30015948436"}}],"dc:title":[{"@value":"High-efficiency soft x-ray emission spectrometer for use with synchrotron radiation excitation"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>A new soft x-ray spectrometer designed for use with photon excitation from synchrotron light sources is described and characterized. Special design features, including a close-spaced input slit, large toroidal gratings, and a two-dimensional charge-coupled-device array based detector system, provide exceptional measuring efficiency in a 5-m Rowland circle design. Descriptions are given of the spectrometer’s mechanical and detector design, and of calibration and alignment procedures. The beam line providing photon excitation from a synchrotron light source is described. Typical electron beam and/or photon excited emission spectra of Al, Si, and LiF are presented and compared with those produced by other instruments.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1383388845458869762","@type":"Researcher","foaf:name":[{"@value":"T. A. Callcott"}],"jpcoar:affiliationName":[{"@value":"Department of Physics, University of Tennessee, Knoxville, Tennessee 37996–1200"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388845458869764","@type":"Researcher","foaf:name":[{"@value":"K. L. Tsang"}],"jpcoar:affiliationName":[{"@value":"Department of Physics, University of Tennessee, Knoxville, Tennessee 37996–1200"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388845458869763","@type":"Researcher","foaf:name":[{"@value":"C. H. Zhang"}],"jpcoar:affiliationName":[{"@value":"Department of Physics, University of Tennessee, Knoxville, Tennessee 37996–1200"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388845458869760","@type":"Researcher","foaf:name":[{"@value":"D. L. Ederer"}],"jpcoar:affiliationName":[{"@value":"Synchrotron Ultraviolet Radiation Facility, National Bureau of Standards, Gaithersburg, Maryland 20899"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388845458869761","@type":"Researcher","foaf:name":[{"@value":"E. T. Arakawa"}],"jpcoar:affiliationName":[{"@value":"Health and Safety Research Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37930"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00346748"},{"@type":"EISSN","@value":"10897623"}],"prism:publicationName":[{"@value":"Review of Scientific Instruments"}],"dc:publisher":[{"@value":"AIP Publishing"}],"prism:publicationDate":"1986-11-01","prism:volume":"57","prism:number":"11","prism:startingPage":"2680","prism:endingPage":"2690"},"reviewed":"false","url":[{"@id":"https://pubs.aip.org/aip/rsi/article-pdf/57/11/2680/19251029/2680_1_online.pdf"}],"createdAt":"2002-07-26","modifiedAt":"2024-02-07","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360567182077135104","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Transmission-grating spectrometer for highly efficient and high-resolution soft X-ray emission studies"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001204180473984","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Resonant Soft X-ray Emission Study of Rutile (TiO2)."},{"@language":"ja-Kana","@value":"Resonant Soft X-ray Emission Study of R"},{"@value":"Resonant Soft X-ray Emission Study of Rutile (TiO<sub><b>2</b></sub>)"}]},{"@id":"https://cir.nii.ac.jp/crid/1520290883160384000","@type":"Article","relationType":["isCitedBy"],"jpcoar:relatedTitle":[{"@value":"軟X線発光分光の新展開--液体・溶液の電子状態研究"},{"@language":"ja-Kana","@value":"ナンXセン ハッコウ ブンコウ ノ シン テンカイ エキタイ ヨウエキ ノ デンシ ジョウタイ ケンキュウ"}]},{"@id":"https://cir.nii.ac.jp/crid/1570854174061938048","@type":"Article","relationType":["isCitedBy"],"jpcoar:relatedTitle":[{"@language":"ja","@value":"軟X線発光実験"},{"@language":"en","@value":"Soft X-Ray Emission Study of Solids"}]},{"@id":"https://cir.nii.ac.jp/crid/1574231873995393920","@type":"Article","relationType":["isCitedBy"],"jpcoar:relatedTitle":[{"@language":"ja","@value":"軟X線分光によるCarrier-doped SrTiO_3の電子構造の研究"},{"@language":"en","@value":"Electronic Structure of Carrier-doped SrTiO_3 Studied by Soft-X-ray Spectroscopy"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.1139078"},{"@type":"CIA","@value":"30015948436"},{"@type":"CROSSREF","@value":"10.1143/jpsj.65.312_references_DOI_Fj4EoaqRClBdd0cYQsL1HwhvTEV"},{"@type":"CROSSREF","@value":"10.1016/j.elspec.2012.06.006_references_DOI_Fj4EoaqRClBdd0cYQsL1HwhvTEV"}]}