{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363388845498944896.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1103/physrevlett.74.3241"}},{"identifier":{"@type":"URI","@value":"http://link.aps.org/article/10.1103/PhysRevLett.74.3241"}},{"identifier":{"@type":"URI","@value":"http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.74.3241/fulltext"}}],"dc:title":[{"@value":"Spectroscopic Measurements of Discrete Electronic States in Single Metal Particles"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380569723137370371","@type":"Researcher","foaf:name":[{"@value":"D. C. Ralph"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388845498944897","@type":"Researcher","foaf:name":[{"@value":"C. T. Black"}]},{"@id":"https://cir.nii.ac.jp/crid/1383388845498944896","@type":"Researcher","foaf:name":[{"@value":"M. Tinkham"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00319007"},{"@type":"EISSN","@value":"10797114"}],"prism:publicationName":[{"@value":"Physical Review Letters"}],"dc:publisher":[{"@value":"American Physical Society (APS)"}],"prism:publicationDate":"1995-04-17","prism:volume":"74","prism:number":"16","prism:startingPage":"3241","prism:endingPage":"3244"},"reviewed":"false","dc:rights":["http://link.aps.org/licenses/aps-default-license"],"url":[{"@id":"http://link.aps.org/article/10.1103/PhysRevLett.74.3241"},{"@id":"http://harvest.aps.org/v2/journals/articles/10.1103/PhysRevLett.74.3241/fulltext"}],"createdAt":"2002-07-27","modifiedAt":"2025-01-03","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360002218581046656","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"NANOSCALE SUPERCONDUCTIVITY"}]},{"@id":"https://cir.nii.ac.jp/crid/1360284924860157824","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Magnetic trapping of superconducting submicron particles produced by laser ablation in superfluid helium"}]},{"@id":"https://cir.nii.ac.jp/crid/1360285707409162880","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Superconducting doped topological materials"}]},{"@id":"https://cir.nii.ac.jp/crid/1360302866846808064","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Few-body Bose gases in low dimensions—A laboratory for quantum dynamics"}]},{"@id":"https://cir.nii.ac.jp/crid/1360567184372886784","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Control of charging energy in chemically assembled nanoparticle single-electron transistors"}]},{"@id":"https://cir.nii.ac.jp/crid/1360580229835904128","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Variable-Barrier Quantum Coulomb Blockade Effect in Nanoscale Transistors"}]},{"@id":"https://cir.nii.ac.jp/crid/1360580232428186624","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Double gate operation of metal nanodot array based single electron device"}]},{"@id":"https://cir.nii.ac.jp/crid/1360848658176714240","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Ideal Discrete Energy Levels in Synthesized Au Nanoparticles for Chemically Assembled Single-Electron Transistors"}]},{"@id":"https://cir.nii.ac.jp/crid/1361975843658272896","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Discrete quantum levels and Zeeman splitting in ultra-thin gold-nanowire quantum dots"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001205294684032","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Fabrication and Developments of Nano-gap Electrode using Self-assembled Molecular Lithography"},{"@language":"ja","@value":"自己組織化分子リソグラフィーによるナノギャップ電極作製法の開発と応用"},{"@language":"ja-Kana","@value":"ジコ ソシキカ ブンシ リソグラフィー ニ ヨル ナノギャップ デンキョク サクセイホウ ノ カイハツ ト オウヨウ"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001206251488000","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Current Reversal of Photon-assisted Tunneling in a Quantum Dot Connected to Superconducting Leads."}]},{"@id":"https://cir.nii.ac.jp/crid/1390001206266896000","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Atomic Force Microscope Current-Imaging Study for Current Density through Nanocrystalline Silicon Dots Embedded in SiO2"},{"@value":"Atomic Force Microscope Current-Imaging Study for Current Density through Nanocrystalline Silicon Dots Embedded in SiO<sub>2</sub>"}]},{"@id":"https://cir.nii.ac.jp/crid/1390282679161461248","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Pairing Correlation Effect on the Zero-Bias Tunneling Spectra of Ultrasmall Superconducting Grains."}]},{"@id":"https://cir.nii.ac.jp/crid/1390282679161521152","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"A Simple Perturbation Theory of a Quantum Dot Coupled to Superconducting Leads."},{"@language":"ja-Kana","@value":"Simple Perturbation Theory of a Quantum Dot Coupled to Superconducting Leads"}]},{"@id":"https://cir.nii.ac.jp/crid/1390282679163718528","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Parity Effects in Nanoscale Metallic Grain Including a Magnetic Impurity"}]},{"@id":"https://cir.nii.ac.jp/crid/1520572358466665088","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Fabrication of nanogap electrodes by the molecular lithography technique"},{"@language":"ja-Kana","@value":"Fabrication of nanogap electrodes by the molecular lithography technique"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1103/physrevlett.74.3241"},{"@type":"CROSSREF","@value":"10.1142/s0217979212300137_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.7567/apex.10.022701_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1016/j.physrep.2023.10.004_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1088/0957-4484/26/4/045702_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1016/j.physc.2015.02.018_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.3131/jvsj2.55.333_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1143/jpsj.70.2497_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1143/jjap.40.4559_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.3390/nano12244437_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1038/s41598-022-15734-1_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1143/jjap.50.035204_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.7567/jjap.50.035204_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1143/jpsj.70.492_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1143/jpsj.73.2349_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1143/jjap.44.l88_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1021/nn303585g_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"},{"@type":"CROSSREF","@value":"10.1063/1.5085230_references_DOI_5l8gCo6AuP3UXtoa6Ht7OWGxO1h"}]}