著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
S. Brehme and F. Fenske and W. Fuhs and E. Nebauer and M. Poschenrieder and B. Selle and I. Sieber,Free-carrier plasma resonance effects and electron transport in reactively sputtered degenerate ZnO:Al films,Thin Solid Films,0040-6090,Elsevier BV,1999-03,342,1-2,167-173,https://cir.nii.ac.jp/crid/1363388845554362240,https://doi.org/10.1016/s0040-6090(98)01490-4