著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
T. F. Schatzki and R. P. Haff and R. Young and I. Can and L-C. Le and N. Toyofuku,DEFECT DETECTION IN APPLES BY MEANS OF X-RAY IMAGING,Transactions of the ASAE,2151-0059,American Society of Agricultural and Biological Engineers (ASABE),1997,40,5,1407-1415,https://cir.nii.ac.jp/crid/1363388845761593728,https://doi.org/10.13031/2013.21367