Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
T. Tawara and S. Matsunaga and T. Fujimoto and M. Ryo and M. Miyazato and T. Miyazawa and K. Takenaka and M. Miyajima and A. Otsuki and Y. Yonezawa and T. Kato and H. Okumura and T. Kimoto and H. Tsuchida,Injected carrier concentration dependence of the expansion of single Shockley-type stacking faults in 4H-SiC PiN diodes,Journal of Applied Physics,0021-8979,AIP Publishing,2018-01-11,123,2,025707,https://cir.nii.ac.jp/crid/1363670318545765504,https://doi.org/10.1063/1.5009365