著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
S. Carmignato and L. De Chiffre and H. Bosse and R.K. Leach and A. Balsamo and W.T. Estler,Dimensional artefacts to achieve metrological traceability in advanced manufacturing,CIRP Annals,0007-8506,Elsevier BV,2020,69,2,693-716,https://cir.nii.ac.jp/crid/1363670318912629888,https://doi.org/10.1016/j.cirp.2020.05.009