Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Xin Xu and Marcelo Davanco and Xiangfei Qi and Stephen R. Forrest,Direct transfer patterning on three dimensionally deformed surfaces at micrometer resolutions and its application to hemispherical focal plane detector arrays,Organic Electronics,1566-1199,Elsevier BV,2008-12,9,6,1122-1127,https://cir.nii.ac.jp/crid/1363670318940487552,https://doi.org/10.1016/j.orgel.2008.07.011