著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
J. Robertson and Y. Guo and L. Lin,Defect state passivation at III-V oxide interfaces for complementary metal–oxide–semiconductor devices,Journal of Applied Physics,0021-8979,AIP Publishing,2015-03-16,117,11,,https://cir.nii.ac.jp/crid/1363670318980509696,https://doi.org/10.1063/1.4913832