{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363670319467067392.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1007/s003390050359"}}],"dc:title":[{"@value":"Femtosecond, picosecond and nanosecond laser ablation of solids"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380013168748107533","@type":"Researcher","foaf:name":[{"@value":"B. N. Chichkov"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319467067394","@type":"Researcher","foaf:name":[{"@value":"C. Momma"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319467067396","@type":"Researcher","foaf:name":[{"@value":"S. Nolte"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319467067393","@type":"Researcher","foaf:name":[{"@value":"F. von Alvensleben"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319467067395","@type":"Researcher","foaf:name":[{"@value":"A. Tünnermann"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"09478396"},{"@type":"EISSN","@value":"14320630"}],"prism:publicationName":[{"@value":"Applied Physics A: Materials Science & Processing"}],"dc:publisher":[{"@value":"Springer Science and Business Media LLC"}],"prism:publicationDate":"1996-07-25","prism:volume":"63","prism:number":"2","prism:startingPage":"109","prism:endingPage":"115"},"reviewed":"false","createdAt":"2002-08-25","modifiedAt":"2019-11-04","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360013168748107520","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Selective Laser Ablation of Metal Thin Films Using Ultrashort Pulses"}]},{"@id":"https://cir.nii.ac.jp/crid/1390861648443650944","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Shock Wave Detection for In-Process Depth Measurement in Laser Ablation Using a Photonic Nanojet"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1007/s003390050359"},{"@type":"CROSSREF","@value":"10.1007/s40684-020-00272-w_references_DOI_aIDFflfG6quZEacY5RHcBkgPj4l"},{"@type":"CROSSREF","@value":"10.20965/ijat.2024.p0058_references_DOI_aIDFflfG6quZEacY5RHcBkgPj4l"}]}