{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363670319987371904.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1063/1.4823704"}},{"identifier":{"@type":"URI","@value":"https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4823704/13192499/141908_1_online.pdf"}}],"dc:title":[{"@value":"Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>Atomic-resolution elemental maps of materials obtained using energy-loss spectroscopy in the scanning transmission electron microscope (STEM) can contain artifacts associated with strong elastic scattering of the STEM probe. We demonstrate how recent advances in instrumentation enable a simple and robust approach to reduce such artifacts and produce atomic-resolution elemental maps amenable to direct visual interpretation. The concept is demonstrated experimentally for a (BaTiO3)8/(SrTiO3)4 heterostructure, and simulations are used for quantitative analysis. We also demonstrate that the approach can be used to eliminate the atomic-resolution elastic contrast in maps obtained from lower-energy excitations, such as plasmon excitations.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1383670319987371908","@type":"Researcher","foaf:name":[{"@value":"Y. Zhu"}],"jpcoar:affiliationName":[{"@value":"Monash Centre for Electron Microscopy, Monash University 1 , Victoria 3800, Australia"},{"@value":"Department of Materials Engineering, Monash University 2 , Victoria 3800, Australia"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319987371906","@type":"Researcher","foaf:name":[{"@value":"A. Soukiassian"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering, Cornell University 3 , Ithaca, New York 14853, USA"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319987371904","@type":"Researcher","foaf:name":[{"@value":"D. G. Schlom"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering, Cornell University 3 , Ithaca, New York 14853, USA"},{"@value":"Kavli Institute at Cornell for Nanoscale Science 4 , Ithaca, New York 14853, USA"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319987371907","@type":"Researcher","foaf:name":[{"@value":"D. A. Muller"}],"jpcoar:affiliationName":[{"@value":"Kavli Institute at Cornell for Nanoscale Science 4 , Ithaca, New York 14853, USA"},{"@value":"School of Applied and Engineering Physics, Cornell University 5 , Ithaca, New York 14853, USA"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670319987371905","@type":"Researcher","foaf:name":[{"@value":"C. Dwyer"}],"jpcoar:affiliationName":[{"@value":"Monash Centre for Electron Microscopy, Monash University 1 , Victoria 3800, Australia"},{"@value":"Department of Materials Engineering, Monash University 2 , Victoria 3800, Australia"},{"@value":"Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons, and Peter Grünberg Institute 6 , Forschungszentrum Jülich, D-52425 Jülich, Germany"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00036951"},{"@type":"EISSN","@value":"10773118"}],"prism:publicationName":[{"@value":"Applied Physics Letters"}],"dc:publisher":[{"@value":"AIP Publishing"}],"prism:publicationDate":"2013-09-30","prism:volume":"103","prism:number":"14","prism:startingPage":"141908"},"reviewed":"false","url":[{"@id":"https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4823704/13192499/141908_1_online.pdf"}],"createdAt":"2013-10-02","modifiedAt":"2023-08-01","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360567183051023616","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Practical Aspects of Removing the Effects of Elastic and Thermal Diffuse Scattering from Spectroscopic Data for Single Crystals"}]},{"@id":"https://cir.nii.ac.jp/crid/1360846641119214848","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"On the quantitativeness of EDS STEM"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.4823704"},{"@type":"CROSSREF","@value":"10.1017/s1431927614000804_references_DOI_5ZXiY7PtWVymiKPjr7iG6SkbU0b"},{"@type":"CROSSREF","@value":"10.1016/j.ultramic.2014.11.029_references_DOI_5ZXiY7PtWVymiKPjr7iG6SkbU0b"}]}