著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Steve J. Chipera and David L. Bish,<i>FULLPAT</i>: a full-pattern quantitative analysis program for X-ray powder diffraction using measured and calculated patterns,Journal of Applied Crystallography,0021-8898,International Union of Crystallography (IUCr),2002-11-13,35,6,744-749,https://cir.nii.ac.jp/crid/1363670320039188096,https://doi.org/10.1107/s0021889802017405