著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
D. C. Worledge and P. L. Trouilloud,Magnetoresistance measurement of unpatterned magnetic tunnel junction wafers by current-in-plane tunneling,Applied Physics Letters,0003-6951,AIP Publishing,2003-07-07,83,1,84-86,https://cir.nii.ac.jp/crid/1363670320423833600,https://doi.org/10.1063/1.1590740