{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363670320579137664.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1063/1.1289803"}},{"identifier":{"@type":"URI","@value":"https://pubs.aip.org/aip/apl/article-pdf/77/8/1155/18551619/1155_1_online.pdf"}}],"dc:title":[{"@value":"Grain-size-dependent thermal conductivity of nanocrystalline yttria-stabilized zirconia films grown by metal-organic chemical vapor deposition"}],"description":[{"type":"abstract","notation":[{"@value":"<jats:p>A grain-size-dependent reduction in the room-temperature thermal conductivity of nanocrystalline yttria-stabilized zirconia is reported for the first time. Films were grown by metal-organic chemical vapor deposition with controlled grain sizes from 10 to 100 nm. For grain sizes smaller than approximately 30 nm, a substantial reduction in thermal conductivity was observed, reaching a value of less than one-third the bulk value at the smallest grain sizes measured. The observed behavior is consistent with expectations based on an estimation of the phonon mean-free path in zirconia.</jats:p>"}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1383670320579137664","@type":"Researcher","foaf:name":[{"@value":"G. Soyez"}],"jpcoar:affiliationName":[{"@value":"Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137665","@type":"Researcher","foaf:name":[{"@value":"J. A. Eastman"}],"jpcoar:affiliationName":[{"@value":"Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137670","@type":"Researcher","foaf:name":[{"@value":"L. J. Thompson"}],"jpcoar:affiliationName":[{"@value":"Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137668","@type":"Researcher","foaf:name":[{"@value":"G.-R. Bai"}],"jpcoar:affiliationName":[{"@value":"Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137536","@type":"Researcher","foaf:name":[{"@value":"P. M. Baldo"}],"jpcoar:affiliationName":[{"@value":"Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137671","@type":"Researcher","foaf:name":[{"@value":"A. W. McCormick"}],"jpcoar:affiliationName":[{"@value":"Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137669","@type":"Researcher","foaf:name":[{"@value":"R. J. DiMelfi"}],"jpcoar:affiliationName":[{"@value":"Reactor Engineering Division, Argonne National Laboratory, Argonne, Illinois 60439"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137537","@type":"Researcher","foaf:name":[{"@value":"A. A. Elmustafa"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137666","@type":"Researcher","foaf:name":[{"@value":"M. F. Tambwe"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320579137667","@type":"Researcher","foaf:name":[{"@value":"D. S. Stone"}],"jpcoar:affiliationName":[{"@value":"Department of Materials Science and Engineering, University of Wisconsin, Madison, Wisconsin 53706"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00036951"},{"@type":"EISSN","@value":"10773118"}],"prism:publicationName":[{"@value":"Applied Physics Letters"}],"dc:publisher":[{"@value":"AIP Publishing"}],"prism:publicationDate":"2000-08-21","prism:volume":"77","prism:number":"8","prism:startingPage":"1155","prism:endingPage":"1157"},"reviewed":"false","url":[{"@id":"https://pubs.aip.org/aip/apl/article-pdf/77/8/1155/18551619/1155_1_online.pdf"}],"createdAt":"2002-07-26","modifiedAt":"2024-02-03","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360847871764798336","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Interfacial Thermal Resistance and Thermal Conductivity in Nanograined SrTiO<sub>3</sub>"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.1289803"},{"@type":"CROSSREF","@value":"10.1143/apex.3.031101_references_DOI_DP88osPtiJUv0Xuuu7f1Un2SSio"}]}