{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363670320857441536.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1016/j.nima.2006.10.283"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S016890020602167X?httpAccept=text/xml"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S016890020602167X?httpAccept=text/plain"}}],"dc:title":[{"@value":"A very large area Micro Pixel Chamber"}],"description":[{"notation":[{"@value":"Abstract   A Micro Pixel Chamber, called “   μ   -PIC”, is a gaseous 2D imaging detector with a fine pixel electrode based on the Printed Circuit Board technology, and we developed it for the X/gamma-ray imaging and the tracking of the charged particles [A. Ochi, et al., Nucl. Instr. and Meth. A 478 (2002) 196; T. Nagayoshi, et al., Nucl. Instr. and Meth. A 525 (2004) 20.]. The previous    μ   -PIC has a fine position resolution, a high gas gain, a good gas gain uniformity and the stable operation. Although the detection area of the previous    μ   -PIC    (  ∼  10  ×  10      cm    2    )    is not large enough for a variety of the application, for example an MeV gamma-ray Compton camera [T. Tanimori, et al., New Astron. Rev. 48 (2004) 263.] and dark matter search [T. Tanimori, et al., Phys. Lett. B 578 (2004) 241.]. Therefore, we developed a new    μ   -PIC having a    ∼  30  ×  30      cm    2      detection area. The structure and the pitch of the electrode are same as those of the previous    μ   -PIC. There are    768  ×  768    pixels in the whole area. This    μ   -PIC (TOSHIBA SN041129-1) is operated with a stable gas gain of    ∼  3500    and a maximum gain of    ∼  7000    at the center region, and the variety of the gain was 16.7% RMS. An X-ray image of the whole area was also taken by the irradiation of the X-rays from 109Cd (22 keV) to the whole detection area."}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1380004234446878981","@type":"Researcher","foaf:name":[{"@value":"A. Takada"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441542","@type":"Researcher","foaf:name":[{"@value":"K. Hattori"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441545","@type":"Researcher","foaf:name":[{"@value":"S. Kabuki"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441543","@type":"Researcher","foaf:name":[{"@value":"H. Kubo"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441540","@type":"Researcher","foaf:name":[{"@value":"K. Miuchi"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441538","@type":"Researcher","foaf:name":[{"@value":"T. Nagayoshi"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441547","@type":"Researcher","foaf:name":[{"@value":"H. Nishimura"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441548","@type":"Researcher","foaf:name":[{"@value":"Y. Okada"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441546","@type":"Researcher","foaf:name":[{"@value":"R. Orito"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441544","@type":"Researcher","foaf:name":[{"@value":"H. Sekiya"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441537","@type":"Researcher","foaf:name":[{"@value":"A. Takeda"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441541","@type":"Researcher","foaf:name":[{"@value":"T. Tanimori"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670320857441539","@type":"Researcher","foaf:name":[{"@value":"K. Ueno"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"01689002"}],"prism:publicationName":[{"@value":"Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment"}],"dc:publisher":[{"@value":"Elsevier BV"}],"prism:publicationDate":"2007-04","prism:volume":"573","prism:number":"1-2","prism:startingPage":"195","prism:endingPage":"199"},"reviewed":"false","dc:rights":["https://www.elsevier.com/tdm/userlicense/1.0/","https://www.elsevier.com/legal/tdmrep-license"],"url":[{"@id":"https://api.elsevier.com/content/article/PII:S016890020602167X?httpAccept=text/xml"},{"@id":"https://api.elsevier.com/content/article/PII:S016890020602167X?httpAccept=text/plain"}],"createdAt":"2006-11-28","modifiedAt":"2025-09-29","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1050012570392426496","@type":"Article","resourceType":"学術雑誌論文(journal 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