{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1363670321296814080.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1016/s0168-583x(02)00877-7"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0168583X02008777?httpAccept=text/xml"}},{"identifier":{"@type":"URI","@value":"https://api.elsevier.com/content/article/PII:S0168583X02008777?httpAccept=text/plain"}},{"identifier":{"@type":"HANDLE","@value":"2433/4369"}}],"dc:title":[{"@value":"Secondary electron emission from Au by medium energy atomic and molecular ions"}],"description":[{"notation":[{"@value":"Number distributions of secondary electrons emitted from a Au metal surface have been measured for atomic and molecular ions of H þ ,H e þ ,C þ ,N þ ,O þ ,H þ ,H þ , HeH þ ,C O þ and O þ in the energy range 0.3-2.0 MeV. The emission statistics obtained are described fairly well by a Pfunction. The P� o parameter b, determining the distribution shape, is found to decrease monotonously with increasing emission yield c, revealing a surprising relationship of bc � 1 over the different projectile species and impact energies. This finding supports certainly the electron cascading model. Also we find a strong negative molecular effect for heavier molecular ions, showing a significant reduction of c com- pared to the estimated values using constituent atomic projectile data. 2002 Elsevier Science B.V. All rights reserved."}]}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1383670321296814082","@type":"Researcher","foaf:name":[{"@value":"A. Itoh"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670321296814080","@type":"Researcher","foaf:name":[{"@value":"T. Majima"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670321296814081","@type":"Researcher","foaf:name":[{"@value":"F. Obata"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670321296814084","@type":"Researcher","foaf:name":[{"@value":"Y. Hamamoto"}]},{"@id":"https://cir.nii.ac.jp/crid/1383670321296814083","@type":"Researcher","foaf:name":[{"@value":"A. Yogo"}]}],"contributor":[{"@id":"https://cir.nii.ac.jp/crid/1893962440751963392","@type":"Researcher","foaf:name":[{"@value":"90243055"}]},{"@id":"https://cir.nii.ac.jp/crid/1893962440751963393","@type":"Researcher","foaf:name":[{"@value":"50515038"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"0168583X"}],"prism:publicationName":[{"@value":"Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms"}],"dc:publisher":[{"@value":"Elsevier BV"}],"prism:publicationDate":"2002-06","prism:volume":"193","prism:number":"1-4","prism:startingPage":"626","prism:endingPage":"631"},"reviewed":"false","dc:rights":["https://www.elsevier.com/tdm/userlicense/1.0/","https://www.elsevier.com/legal/tdmrep-license"],"url":[{"@id":"https://api.elsevier.com/content/article/PII:S0168583X02008777?httpAccept=text/xml"},{"@id":"https://api.elsevier.com/content/article/PII:S0168583X02008777?httpAccept=text/plain"}],"createdAt":"2002-10-10","modifiedAt":"2025-09-29","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=secondary%20electron%20emission","dc:title":"secondary electron emission"},{"@id":"https://cir.nii.ac.jp/all?q=molecular%20beam","dc:title":"molecular beam"},{"@id":"https://cir.nii.ac.jp/all?q=electron%20emission%20statistics","dc:title":"electron emission statistics"}],"relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1050564285755893120","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Correlation between multiple ionization and fragmentation of C{2}H{6} in charge-changing collisions with 580−keVC[+]"},{"@value":"Correlation between multiple ionization and fragmentation of<mml:math xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"><mml:mrow><mml:msub><mml:mi mathvariant=\"normal\">C</mml:mi><mml:mn>2</mml:mn></mml:msub><mml:msub><mml:mi mathvariant=\"normal\">H</mml:mi><mml:mn>6</mml:mn></mml:msub></mml:mrow></mml:math>in charge-changing collisions with<mml:math xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"><mml:mrow><mml:mn>580</mml:mn><mml:mrow><mml:mtext>−</mml:mtext><mml:mi>keV</mml:mi></mml:mrow><mml:mspace width=\"0.16em\"/><mml:msup><mml:mrow><mml:mi mathvariant=\"normal\">C</mml:mi></mml:mrow><mml:mo>+</mml:mo></mml:msup></mml:mrow></mml:math>"},{"@value":"Correlation between multiple ionization and fragmentation of C2H6 in charge-changing collisions with 580-keV C+"}]},{"@id":"https://cir.nii.ac.jp/crid/1360848657332849792","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Development of high-resolution ERDA with double MCP system and determination of detection limit for H and D"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1016/s0168-583x(02)00877-7"},{"@type":"OPENAIRE","@value":"doi_dedup___::42695fee81cdaab2f09bdffc3577e6e3"},{"@type":"CROSSREF","@value":"10.1103/physreva.90.062711_references_DOI_OtGNXZ7TmP79KiszNIiRQ0sHOrP"},{"@type":"CROSSREF","@value":"10.1016/j.nimb.2018.05.043_references_DOI_OtGNXZ7TmP79KiszNIiRQ0sHOrP"}]}