著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Juan Antonio Maestro and Pedro Reviriego and Costas Argyrides and Dhiraj K. Pradhan,Fault Tolerant Single Error Correction Encoders,Journal of Electronic Testing,0923-8174,Springer Science and Business Media LLC,2011-03-30,27,2,215-218,https://cir.nii.ac.jp/crid/1363951796107722368,https://doi.org/10.1007/s10836-011-5208-9