著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
T.J. Lewis,Interfaces are the dominant feature of dielectrics at the nanometric level,IEEE Transactions on Dielectrics and Electrical Insulation,1070-9878,Institute of Electrical and Electronics Engineers (IEEE),2004-10,11,5,739-753,https://cir.nii.ac.jp/crid/1364233268442575488,https://doi.org/10.1109/tdei.2004.1349779