Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Laurent Artola and Guillaume Hubert and Kevin M. Warren and Marc Gaillardin and Ronald D. Schrimpf and Robert A. Reed and Robert A. Weller and Jonathan R. Ahlbin and Philippe Paillet and Melanie Raine and Sylvain Girard and Sophie Duzellier and Lloyd W. Massengill and Francoise Bezerra,SEU Prediction From SET Modeling Using Multi-Node Collection in Bulk Transistors and SRAMs Down to the 65 nm Technology Node,IEEE Transactions on Nuclear Science,0018-9499,Institute of Electrical and Electronics Engineers (IEEE),2011-06,58,3,1338-1346,https://cir.nii.ac.jp/crid/1364233269147940864,https://doi.org/10.1109/tns.2011.2144622