Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
A.C. Diebold and B. Foran and C. Kisielowski and D.A. Muller and S.J. Pennycook and E. Principe and S. Stemmer,Thin Dielectric Film Thickness Determination by Advanced Transmission Electron Microscopy,Microscopy and Microanalysis,1431-9276,Oxford University Press (OUP),2003-11-21,9,6,493-508,https://cir.nii.ac.jp/crid/1364233269930843392,https://doi.org/10.1017/s1431927603030629