A low-temperature dynamic mode scanning force microscope operating in high magnetic fields

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  • J. Rychen
    Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
  • T. Ihn
    Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
  • P. Studerus
    Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
  • A. Herrmann
    Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland
  • K. Ensslin
    Laboratory of Solid State Physics, ETH Hönggerberg, CH-8093 Zürich, Switzerland

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<jats:p>A scanning force microscope was implemented operating at temperatures below 4.2 K and in magnetic fields up to 8 T. Piezoelectric quartz tuning forks were employed for nonoptical tip–sample distance control in the dynamic operation mode. Fast response was achieved by using a phase-locked loop for driving the mechanical oscillator. Possible applications of this setup for various scanning probe techniques are discussed.</jats:p>

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