著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
M.S. Finkelstein,A scale model of general repair,Microelectronics Reliability,0026-2714,Elsevier BV,1993-01,33,1,41-44,https://cir.nii.ac.jp/crid/1364233270640904064,https://doi.org/10.1016/0026-2714(93)90042-w