著者名,タイトル,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kim,Strained hetero interfaces in Si/SiGe/SiGe/SiGe multi-layers studied by scanning moiré fringe imaging,J Appl Phys,,,2013,114,,,https://cir.nii.ac.jp/crid/1371694367043061892,