{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1380004239353490567.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@value":"Ayumu Saitoh"}],"foaf:familyName":[{"@value":"Saitoh"}],"foaf:givenName":[{"@value":"Ayumu"}]}],"career":[{"institution":{"notation":[{"@value":"Department of Informatics, Yamagata University, , , Japan"}]}}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1360004239353490432","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.3233/jae-171206"},{"@type":"URI","@value":"https://content.iospress.com/download?id=10.3233/JAE-171206"}],"notation":[{"@value":"High-performance linear-system solver for shielding current analysis in cracked HTS film"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.3233/jae-171206_5VEQyTVJ48BqsXcHb8kc6oTQtsG"},{"@type":"OPENAIRE","@value":"doi_dedup___::d2307c2a61da7378bab3c2c5e455f012_5VEQyTVJ48BqsXcHb8kc6oTQtsG"}]}