{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1380011144123799680.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@value":"Silas E. Gustafsson"}],"foaf:familyName":[{"@value":"Gustafsson"}],"foaf:givenName":[{"@value":"Silas E."}]}],"career":[{"institution":{"notation":[{"@value":"Department of Physics, Chalmers University of Technology, S-412 96 Gothenburg, Sweden"}]}}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1360011144123799680","@type":"Article","productIdentifier":[{"@type":"DOI","@value":"10.1063/1.1142087"},{"@type":"URI","@value":"https://pubs.aip.org/aip/rsi/article-pdf/62/3/797/19227197/797_1_online.pdf"}],"notation":[{"@value":"Transient plane source techniques for thermal conductivity and thermal diffusivity measurements of solid materials"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.1142087_C8rcAmhdv0CbXXxELZeccden3lC"}]}