{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1380298342572123777.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@value":"F. Rupin"}],"foaf:familyName":[{"@value":"Rupin"}],"foaf:givenName":[{"@value":"F."}]}],"career":[{"institution":{"notation":[{"@value":"1EDF R&D, Materials and Mechanics of Components Department, EDF Lab Les Renardières, 77818 Moret sur Loing, France"}]}}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1360298342572123776","@type":"Article","productIdentifier":[{"@type":"DOI","@value":"10.1063/1.4882421"},{"@type":"URI","@value":"https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/1.4882421/13941438/234105_1_online.pdf"}],"notation":[{"@value":"A random matrix approach to detect defects in a strongly scattering polycrystal: How the memory effect can help overcome multiple scattering"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1063/1.4882421_W1JuRBWT17w55Pz4baZxO4thGx9"}]}