{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1380865815494046850.json","@type":"Researcher","foaf:Person":[{"foaf:name":[{"@value":"Tsunenobu Kimoto"}],"foaf:familyName":[{"@value":"Kimoto"}],"foaf:givenName":[{"@value":"Tsunenobu"}]}],"career":[{"institution":{"notation":[{"@value":"Department of Electronic Science and Engineering Kyoto University  Nishikyo Kyoto 615-8510 Japan"}]}}],"product":[{"@id":"https://cir.nii.ac.jp/crid/1360865815494046848","@type":"Article","resourceType":"学術雑誌論文(journal article)","productIdentifier":[{"@type":"DOI","@value":"10.1002/pssb.202300275"},{"@type":"URI","@value":"https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssb.202300275"}],"notation":[{"@value":"Experimental and Theoretical Study on Anisotropic Electron Mobility in 4H‐SiC"}],"relation":[{"type":"creator"}]}],"dataSourceIdentifier":[{"@type":"CROSSREF","@value":"10.1002/pssb.202300275_UuHq3nQXlG0pbhjZGBshyl9XlDS"},{"@type":"OPENAIRE","@value":"doi_________::b27b5b31b45957b3e57446b49c81bc01_UuHq3nQXlG0pbhjZGBshyl9XlDS"}]}