Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Suzuki Yoshishige,Dynamical Observation of the Thin Film Growth Processes Using Reflective High-Energy Electron Diffraction(RHEED).,Materia Japan,1340-2625,The Japan Institute of Metals and Materials,1996,35,1,53-59,https://cir.nii.ac.jp/crid/1390001204055986560,https://doi.org/10.2320/materia.35.53