Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
AKIMOTO Koichi,Frontiers in Crystallography with Synchrotron Radiation. X-ray Studies near Absorption Edges of Elements. Atom-Selective Experiments. Multiple Wavelength Dispersion Analysis of Semiconductor Interface Structure.,Nihon Kessho Gakkaishi,03694585,The Crystallographic Society of Japan,1997,39,1,45-48,https://cir.nii.ac.jp/crid/1390001204087739008,https://doi.org/10.5940/jcrsj.39.45