Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
MORI Yoshihiro and UEMURA Kenichi,Development of a standard sample preparation method for total-reflection X-ray fluorescence analysis and its semiconductor applications,BUNSEKI KAGAKU,05251931,The Japan Society for Analytical Chemistry,2004,53,2,61-69,https://cir.nii.ac.jp/crid/1390001204354010240,https://doi.org/10.2116/bunsekikagaku.53.61