著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
LI Tsu-Lin and HASHIZUME Masaki and LU Shyue-Kung,An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs,IEICE Transactions on Information and Systems,0916-8532,一般社団法人 電子情報通信学会,2013,E96.D,9,2026-2030,https://cir.nii.ac.jp/crid/1390001204378167296,https://doi.org/10.1587/transinf.e96.d.2026