著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
YOTSUYANAGI Hiroyuki and YAMAMOTO Masayuki and HASHIZUME Masaki,Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops,IEICE Transactions on Information and Systems,0916-8532,一般社団法人 電子情報通信学会,2010,E93-D,1,10-16,https://cir.nii.ac.jp/crid/1390001204379032064,https://doi.org/10.1587/transinf.e93.d.10