Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
YOKOGAWA Shinji,Electromigration Lifetime Test in Damascene Copper Interconnects using Sudden Death Test Structure and OBIRCH,The Journal of Reliability Engineering Association of Japan,09192697,Reliability Engineering Association of Japan,2003,25,8,811-820,https://cir.nii.ac.jp/crid/1390001204452755200,https://doi.org/10.11348/reajshinrai.25.8_811