Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
UEKI Takemi,An Introduction of Device Quality Support and Analysis Service in a Semiconductor Commercial Company(Evaluation Technology for Electron Devise),The Journal of Reliability Engineering Association of Japan,09192697,Reliability Engineering Association of Japan,2010,32,7,484-491,https://cir.nii.ac.jp/crid/1390001204453237760,https://doi.org/10.11348/reajshinrai.32.7_484