Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
KIMACHI Akira and ONUMA Takayuki and ANDO Shigeru,3-D Inspection System for Small Defects on Arbitrarily Curved Surfaces.,IEEJ Transactions on Sensors and Micromachines,13418939,The Institute of Electrical Engineers of Japan,1997,117,4,215-221,https://cir.nii.ac.jp/crid/1390001204460146944,https://doi.org/10.1541/ieejsmas.117.215