Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kimishima Masayuki and Nakayama Yoshikazu and Kogami Yoshinori,RF-SiP Technology of Reflect-meter for RF Testers,"IEEJ Transactions on Electronics, Information and Systems",03854221,The Institute of Electrical Engineers of Japan,2013,133,3,450-463,https://cir.nii.ac.jp/crid/1390001204607935616,https://doi.org/10.1541/ieejeiss.133.450