著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Ng Jin-Aun and Sugii Nobuyuki and Kakushima Kuniyuki and Ahmet Parhat and Tsutsui Kazuo and Hattori Takeo and Iwai Hiroshi,Effective mobility and interface-state density of La2O3 nMISFETs after post deposition annealing,IEICE Electronics Express,1349-2543,一般社団法人 電子情報通信学会,2006,3,13,316-321,https://cir.nii.ac.jp/crid/1390001205212673408,https://doi.org/10.1587/elex.3.316