Transport and magnetic properties of fully-epitaxial superconducting NbN/half-metallic Heulser alloy Co<sub>2</sub>MnSi bilayer films

DOI 3 Citations Open Access
  • Shigeta I.
    Department of Physics and Astronomy, Graduate School of Science and Engineering, Kagoshima University
  • Sakuraba Y.
    Institute for Materials Research, Tohoku University
  • Kimura S.
    Institute for Materials Research, Tohoku University
  • Koyama K.
    Department of Physics and Astronomy, Graduate School of Science and Engineering, Kagoshima University
  • Watanabe K.
    Institute for Materials Research, Tohoku University
  • Takanashi K.
    Institute for Materials Research, Tohoku University
  • Hiroi M.
    Department of Physics and Astronomy, Graduate School of Science and Engineering, Kagoshima University

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  • Transport and magnetic properties of fully-epitaxial superconducting NbN/half-metallic Heulser alloy Co2MnSi bilayer films

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Description

Fully-epitaxial NbN/Co2MnSi bilayer films were grown on MgO(001) single crystalline substrates by a sputter technique. Structural, electric transport and magnetic properties were investigated for the fabricated films. The resulting NbN/Co2MnSi bilayer films show superconducting critical temperature Tc was of 16.0 K and the saturation magnetization Ms at room temperature was of 790 emu/cm3. The electric resistivity of the fabricated films was also measured under magnetic fields and the upper critical field Bc2 was estimated to beBc2 > 30 T in the case of the applied magnetic field parallel to the MgO(001) single crystalline substrate. In addition, NbN/Co2MnSi junctions were made by an electron-beam lithography technique. The enhancement of a zero-bias conductance peak (ZBCP) was observed in differential conductance in the NbN/Co2MnSi junctions. The ZBCP disappeared above Tc = 16.0 K of superconducting NbN films.

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Details 詳細情報について

  • CRID
    1390001205285626624
  • NII Article ID
    130004502825
  • DOI
    10.3379/msjmag.1305r007
  • COI
    1:CAS:528:DC%2BC3sXptVWgur4%3D
  • ISSN
    18822932
    18822924
  • Text Lang
    en
  • Data Source
    • JaLC
    • Crossref
    • CiNii Articles
    • OpenAIRE
  • Abstract License Flag
    Disallowed

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