Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Shirasawa Yuki and Sano Yasuhisa and Murata Junji and Yamauchi Kazuto,Evaluation of GaN Substrate Surface Quality by Characteristics of Schottky Barrier Diode,Proceedings of JSPE Semestrial Meeting,,The Japan Society for Precision Engineering,2009,2009A,0,175-176,https://cir.nii.ac.jp/crid/1390001205651529728,https://doi.org/10.11522/pscjspe.2009a.0.175.0