{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390001205710032768.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.11497/jasmin.2011s.0.160.0"}},{"identifier":{"@type":"NAID","@value":"130005049442"}}],"dc:title":[{"@language":"en","@value":"Frequent Episode Mining method for system logs"},{"@language":"ja","@value":"頻出エピソードマイニングを用いたシステム活用状況の把握"}],"dc:language":"ja","description":[{"type":"abstract","notation":[{"@language":"en","@value":"It is more important for SI vendors to appeal not only \n\"System Construction\" but also \"System Driving Performance\" for\ntheir customers.\n\nSI vendors usually take questionnaires or interview to figure out \nhow customers use the systems. But, the problem of conducing the survey \nsuch as questionnaires or interview is taking time and cost.\n\nIn this paper, we discuss a Frequent Episode Mining method for system logs which automatically track and reveals \ncustomers' usage."},{"@language":"ja","@value":"システムへの投資対効果が求められる今日の状況においては\nシステムの「つくり」だけではなく、「より有効な使い方」を\n訴求していくことが求められている。\n\n使い手の利用状況を把握する手段として、アンケートや対面での\nヒアリングが行われるが、実施に費用、時間がかかるという課題がある。\n\n本発表では、システムのログから頻出エピソードを抽出することで\n機械的に利用状況を把握する手法について議論する。"}],"abstractLicenseFlag":"disallow"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1410853646714173569","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000283890754"}],"foaf:name":[{"@language":"en","@value":"Nomura Tetsuro"},{"@language":"ja","@value":"野村 哲郎"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"（株）NTTデータ技術開発本部"},{"@language":"en","@value":"R&D Headquarters, NTT DATA Corp."}]},{"@id":"https://cir.nii.ac.jp/crid/1410853646714173570","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000283890753"}],"foaf:name":[{"@language":"en","@value":"Nabetani Koichi"},{"@language":"ja","@value":"鍋谷 昴一"}],"jpcoar:affiliationName":[{"@language":"en","@value":"R&D Headquarters, NTT DATA Corp."},{"@language":"ja","@value":"（株）NTTデータ技術開発本部"}]},{"@id":"https://cir.nii.ac.jp/crid/1410853646714173696","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000283890755"}],"foaf:name":[{"@language":"en","@value":"Nakagawa Keiichiro"},{"@language":"ja","@value":"中川 慶一郎"}],"jpcoar:affiliationName":[{"@language":"en","@value":"R&D Headquarters, NTT DATA Corp."},{"@language":"ja","@value":"（株）NTTデータ技術開発本部"}]},{"@id":"https://cir.nii.ac.jp/crid/1420001326217030144","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"10318222"},{"@type":"NRID","@value":"1000010318222"},{"@type":"NRID","@value":"9000002758546"},{"@type":"NRID","@value":"9000409585251"},{"@type":"NRID","@value":"9000409583516"},{"@type":"NRID","@value":"9000399362826"},{"@type":"NRID","@value":"9000411250564"},{"@type":"NRID","@value":"9000409585253"},{"@type":"NRID","@value":"9000414943528"},{"@type":"NRID","@value":"9000337077706"},{"@type":"NRID","@value":"9000270280826"},{"@type":"NRID","@value":"9000406326168"},{"@type":"NRID","@value":"9000310738642"},{"@type":"NRID","@value":"9000406347811"},{"@type":"NRID","@value":"9000404296186"},{"@type":"NRID","@value":"9000410023834"},{"@type":"NRID","@value":"9000405842228"},{"@type":"NRID","@value":"9000409585444"},{"@type":"NRID","@value":"9000406347782"},{"@type":"NRID","@value":"9000404297073"},{"@type":"NRID","@value":"9000409632530"},{"@type":"NRID","@value":"9000406346755"},{"@type":"NRID","@value":"9000347223851"},{"@type":"NRID","@value":"9000404296132"},{"@type":"NRID","@value":"9000404221377"},{"@type":"NRID","@value":"9000397954957"},{"@type":"NRID","@value":"9000406346759"},{"@type":"NRID","@value":"9000413376626"},{"@type":"NRID","@value":"9000392056671"},{"@type":"NRID","@value":"9000410754636"},{"@type":"NRID","@value":"9000399752089"},{"@type":"NRID","@value":"9000405842177"},{"@type":"NRID","@value":"9000399362814"},{"@type":"NRID","@value":"9000405645806"},{"@type":"NRID","@value":"9000347223740"},{"@type":"NRID","@value":"9000347186827"},{"@type":"NRID","@value":"9000415043737"},{"@type":"NRID","@value":"9000415049479"},{"@type":"NRID","@value":"9000405842233"},{"@type":"NRID","@value":"9000406346727"},{"@type":"NRID","@value":"9000347223900"},{"@type":"NRID","@value":"9000347223871"},{"@type":"NRID","@value":"9000254302150"},{"@type":"NRID","@value":"9000415049457"},{"@type":"NRID","@value":"9000392056230"},{"@type":"NRID","@value":"9000404296183"},{"@type":"NRID","@value":"9000410761877"},{"@type":"NRID","@value":"9000386228970"},{"@type":"NRID","@value":"9000002843322"},{"@type":"NRID","@value":"9000406347938"},{"@type":"NRID","@value":"9000409585256"},{"@type":"NRID","@value":"9000405842220"},{"@type":"NRID","@value":"9000404296189"},{"@type":"NRID","@value":"9000324638574"},{"@type":"NRID","@value":"9000347186809"},{"@type":"NRID","@value":"9000405842184"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/read0101746"}],"foaf:name":[{"@language":"en","@value":"Namatame Takashi"},{"@language":"ja","@value":"生田目 崇"}],"jpcoar:affiliationName":[{"@language":"en","@value":"School of Commerce, Senshu University"},{"@language":"ja","@value":"専修大学商学部"}]}],"publication":{"prism:publicationName":[{"@language":"en","@value":"Abstracts of Annual Conference of Japan Society for Management Information"},{"@language":"ja","@value":"経営情報学会　全国研究発表大会要旨集"}],"dc:publisher":[{"@language":"en","@value":"THE JAPAN SOCIETY FOR MANAGEMENT INFORMATION (JASMIN)"},{"@language":"ja","@value":"一般社団法人 経営情報学会"}],"prism:publicationDate":"2011","prism:volume":"2011s","prism:number":"0","prism:startingPage":"160","prism:endingPage":"160"},"availableAt":"2011","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=System%20Log%20analysis","dc:title":"System Log analysis"},{"@id":"https://cir.nii.ac.jp/all?q=Frequent%20Episode%20Mining","dc:title":"Frequent Episode Mining"},{"@id":"https://cir.nii.ac.jp/all?q=%E3%82%B7%E3%82%B9%E3%83%86%E3%83%A0%E3%83%AD%E3%82%B0%E5%88%86%E6%9E%90","dc:title":"システムログ分析"},{"@id":"https://cir.nii.ac.jp/all?q=%E9%A0%BB%E5%87%BA%E3%82%A8%E3%83%94%E3%82%BD%E3%83%BC%E3%83%89%E3%83%9E%E3%82%A4%E3%83%8B%E3%83%B3%E3%82%B0","dc:title":"頻出エピソードマイニング"}],"dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:1003431166"},{"@type":"CIA","@value":"130005049442"}]}