{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390001206012407296.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.11316/jpsgaiyo.63.1.1.0_33_1"}},{"identifier":{"@type":"NAID","@value":"110007143924"}}],"dc:title":[{"@language":"ja","@value":"26pZJ-6 ATLAS実験シリコンストリップ飛跡検出器の解析(半導体検出器,ニュートリノモニター,素粒子実験領域)"},{"@language":"en","@value":"26pZJ-6 Analysis of Silicon strip tracker for ATLAS experiment"}],"dc:language":"ja","creator":[{"@id":"https://cir.nii.ac.jp/crid/1410001205975560578","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000006944551"}],"foaf:name":[{"@language":"ja","@value":"石川 迪雄"},{"@language":"en","@value":"Ishikawa Michio"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Phys. Sci. Osaka Univ."},{"@language":"ja","@value":"大阪大理学物理"}]}],"publication":{"publicationIdentifier":[{"@type":"EISSN","@value":"21890803"},{"@type":"LISSN","@value":"21890803"}],"prism:publicationName":[{"@language":"ja","@value":"日本物理学会講演概要集"},{"@language":"en","@value":"Meeting Abstracts of the Physical Society of Japan"}],"dc:publisher":[{"@language":"en","@value":"The Physical Society of Japan"},{"@language":"ja","@value":"一般社団法人 日本物理学会"}],"prism:publicationDate":"2008","prism:volume":"63.1.1","prism:number":"0","prism:startingPage":"33"},"availableAt":"2008","dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:2003838140"},{"@type":"CIA","@value":"110007143924"}]}