Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kamiura Yoichi and Maeda Takashi and Yamashita Yoshifumi and Nakamura Minoru,Formation of Carbon-Related Defects During the Carbon-Enhanced Annihilation of Thermal Donors in Silicon.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1998,37,2A,L101-L104,https://cir.nii.ac.jp/crid/1390001206247653248,https://doi.org/10.1143/jjap.37.l101