著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Izunome Koji and Miyashita Maki and Ichikawa Akihiko and Kirino Yoshio and Arita Jiro and Ueki Akira,Light Point Defects on Hydrogen Annealed Silicon Wafer.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1997,36,9A/B,L1127-L1129,https://cir.nii.ac.jp/crid/1390001206248495360,https://doi.org/10.1143/jjap.36.l1127