著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Himpsel Franz J. and Jung Thomas and Schlittler Reto and Gimzewski Jim K.,Element-Specific Contrast in Scanning Tunneling Microscopy via Resonant Tunneling.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1996,35,6B,3695-3699,https://cir.nii.ac.jp/crid/1390001206249151104,https://doi.org/10.1143/jjap.35.3695