著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Abe Hajime and Harima Hiroshi and Nakashima Shin–ichi and Tani Masahiko and Sakai Kiyomi and Tokuda Yasunori and Kanamoto Kyozo and Abe Yuji,Characterization of Crystallinity in Low-Temperature-Grown GaAs Layers by Raman Scattering and Time-Resolved Photoreflectance Measurements.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1996,35,12A,5955-5963,https://cir.nii.ac.jp/crid/1390001206250572672,https://doi.org/10.1143/jjap.35.5955