著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Ueno Shuichi and Inoue Yasuo and Inuishi Masahide and Tsubouchi Natsuro,Leakage Mechanism of Local Junctions Forming the Main or Tail Mode of Retention Characteristics for Dynamnic Random Access Memories,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2000,39,4B,1963-1968,https://cir.nii.ac.jp/crid/1390001206251166848,https://doi.org/10.1143/jjap.39.1963