著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Yokoyama Kousuke and Ochi Taketoshi and Yoshimoto Akira and Sugawara Yasuhiro and Morita Seizo,Atomic Resolution Imaging on Si(100)2×1 and Si(100)2×1:H Surfaces with Noncontact Atomic Force Microscopy,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2000,39,2A,L113-L115,https://cir.nii.ac.jp/crid/1390001206252128768,https://doi.org/10.1143/jjap.39.l113